Some fundamental aspects of Auger electron spectroscopy have been reviewed.

介绍了俄歇电子谱术的某些基本问题.

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The mechanism of photo Auger electrons and the secon dary electron yield is discussed.

分析了X射线 光电效应的特点,讨论了俄歇电子和二次电子的产生机制.

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This coordination was confirmed by UV - visible spectra, X - rayphotoelectron spectroscopy ( XPS ) and Auger electron spectroscopy ( AES ).

UV-vis 、 X—射线光电子能谱 ( XPS ) 和俄歇电子能谱 ( AES ) 证实了这种配位作用.

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The authors study action mechanism of the combined collector on the minerals by AES and ESCA.

并利用俄歇电子能谱(AES)和光电子能谱(ESCA)等测试手段,研究了混合捕收剂与矿物的作用机理.

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The accuracy of ordinary method of quantitative analysis by Auger electron spectros - copy is about 30 %.

俄歇电子谱定量分析的通常方法的准确度为±30%.

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The Ge mole fraction of 15 - 16 % was determined by Auger electron spectroscopy ( AES ).

俄歇电子谱 ( AES) 测试表明,所制备的Si_ (1-x ) Ge_x中Ge含量约为15-16%.

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